IMPROVING THE RELIABILITY OF PULSED LASER RANGEFINDER AND INFRARED DEVICES OF HOMING AND SURVEILLANCE BY FINAL ELECTRON BEAM PROCESSING OF THEIR OPTICAL COMPONENTS

Abstract

To prevent the negative impact of external thermal actions on reliability of devices for measurement and thermal testing of objects of various physical nature the practical impo rtance has electron beam processing of surfaces of optical elements has practical importance, because it prevents appearance of defe cts on the surface of elements which lead to a sharp degradation of performance of devices and their failures during operation.