Please use this identifier to cite or link to this item: https://er.chdtu.edu.ua/handle/ChSTU/9979
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dc.contributor.authorTychkov, Dmytro-
dc.contributor.authorBondarenko, Maksym-
dc.contributor.authorТичков, Дмитро Володимирович-
dc.contributor.authorБондаренко, Максим Олексійович-
dc.date.accessioned2026-09-03T12:28:28Z-
dc.date.available2026-09-03T12:28:28Z-
dc.date.issued2025-
dc.identifier.urihttps://er.chdtu.edu.ua/handle/ChSTU/9979-
dc.description.abstractThis study focuses on developing and validating an information-measurement system for low-intensity electric fields. It examines the impact of external factors such as temperature, humidity, and mechanical stress on measurement accuracy and reliability. Advanced experiment planning using Sobol’s LPτ-sequences enabled precise data collection with an atomic force microscope sensor. Regression models were built and statistically validated to predict field characteristics under varying environmental conditions. The results demonstrate high measurement stability and metrological compatibility, highlighting the system’s potential for industrial and educational applicationsuk_UA
dc.language.isoenuk_UA
dc.publisherScientific Research Methodology – 2025. Proceedings Ukrainian Scientific and Practical Conference. Cherkasy. 2025uk_UA
dc.subjectlow-intensity electric fieldsuk_UA
dc.subjectmeasurement systemuk_UA
dc.subjectatomic force microscopeuk_UA
dc.subjectregression modelinguk_UA
dc.subjectexternal factors influenceuk_UA
dc.subjectSobol`s LPτ-sequencesuk_UA
dc.subjectmeasurement accuracy and reliabilityuk_UA
dc.titleAnalysis of the influence of external factors on the accuracy and reliability of measurements of low-intensity electric fields using an information-measurement systemuk_UA
dc.typePublication in Conference Proceedingsuk_UA
dc.citation.spage91uk_UA
dc.citation.epage92uk_UA
Appears in Collections:Наукові публікації викладачів (ФЕТАМ)

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