Please use this identifier to cite or link to this item: https://er.chdtu.edu.ua/handle/ChSTU/9979
Title: Analysis of the influence of external factors on the accuracy and reliability of measurements of low-intensity electric fields using an information-measurement system
Authors: Tychkov, Dmytro
Bondarenko, Maksym
Тичков, Дмитро Володимирович
Бондаренко, Максим Олексійович
Keywords: low-intensity electric fields;measurement system;atomic force microscope;regression modeling;external factors influence;Sobol`s LPτ-sequences;measurement accuracy and reliability
Issue Date: 2025
Publisher: Scientific Research Methodology – 2025. Proceedings Ukrainian Scientific and Practical Conference. Cherkasy. 2025
Abstract: This study focuses on developing and validating an information-measurement system for low-intensity electric fields. It examines the impact of external factors such as temperature, humidity, and mechanical stress on measurement accuracy and reliability. Advanced experiment planning using Sobol’s LPτ-sequences enabled precise data collection with an atomic force microscope sensor. Regression models were built and statistically validated to predict field characteristics under varying environmental conditions. The results demonstrate high measurement stability and metrological compatibility, highlighting the system’s potential for industrial and educational applications
URI: https://er.chdtu.edu.ua/handle/ChSTU/9979
First Page: 91
End Page: 92
Appears in Collections:Наукові публікації викладачів (ФЕТАМ)

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